A model to predict image formation in the three-dimensional field ion microscope

Field ion microscopy (FIM) was the first technique to image individual atoms on surface of a material. By careful control field evaporation atoms, bulk material is exposed, and, through digital processing sequence micrographs, an atomically-resolved three-dimensional reconstruction can be achieved. 3DFIM particularly suited direct observation crystalline defects that underpin physical properties materials: vacancies and vacancy clusters, interstitials, dislocations, or grain boundaries. Yet, further developments are necessary turn it into routines technique. Here, we introduce protocol for subsequent tomographic reconstruction. Second, propose numerical model enabling simulation FIM imaging process. The combines meshless algorithm proposed by Rolland et al. (Robin–Rolland Model, RRM) with fundamental aspects ionization process gas involved in FIM. enables artefacts induced non-regular disturbed electric distribution near atomic defects. Our more precise interpretation characterization structural